COXEM manufactures and provides Scanning Electron Microscope (SEM), the most widely used platform technology in Nano- Metrology of Nano-scale. As a partner of Nano-fusion technology that changes industrial condition in 21 century, COXEM tries to provide the best quality service.

EM-30N
EM-30AXN
EM-30AXP
CX-200Plus

The CX-200PLUS product is developed for simple use by users through compact design and the upgraded software Nano-station 4.0.

  • Compact and Strong Performance
  • 3nm Resolution
  • Standard SE, BSE Detector
  • Standard Chamber Scope
  • Standard Panorama
  • Signal Mixing
  • Fully Compatible EDS
  • 10 Ports for Third party

Optional Products

 

Ion Coater SPT-20
BSE Detector
CP- 8000 Cross Section Polisher
Low Vacuum Systems